[Spectroscopic study on film formation mechanism and structure of composite silanes-V-Zr passive film].

A composite silanes-V-Zr passive film was overlayed on hot-dip galvanized steel. Attenuated total reflection Fourier transformed infrared spectroscopy (ATR-FTIR), X-ray photoelectron spectrometer (XPS) and radio frequency glow discharge optical emission spectrometry (rf-GD-OES) were used to characterize the molecular structure of the silanes-V-Zr passive film. The mechanism of film formation was discussed: The results show that the silane molecules are crosslinked as the main film former and inorganic inhibitor is even distributed in the film.

[XPS analysis of chromium element in chromate passivation film formed on tinplate in different surface state].

X-ray photoelectron spectroscopy (XPS) was used to investigate the content and chemical valence of chromium element, and the content of compounds in chromate passive film formed on commercial tinplate via a cathodic electrolytical treatment. The effect of the content and chemical valence for different surface state was studied by using ultrasonic process. From the results, it was shown that there existed Cr, O and Sn in the passivation film.