Guang Pu Xue Yu Guang Pu Fen Xi
November 2016
Spectral reflectance data quality is important for computer color matching. There are two existing methods for evaluating the quality—spectral reflectance method and K/S method, which are too complex to apply. In this paper, 45°/0° and d/8° geometric conditions are used in the measurement of spectral reflectance of the offset ink samples printed on coated paper and silver-foiled paper while improvement on the geometric condition is made on the basis of the spectral reflectance method.
View Article and Find Full Text PDF