Comparison of dual-energy computed tomography (DECT) polychromatic and monochromatic images with and without iterative metal artifact reduction algorithm in patients with dental implants.

Background: Dual-energy computed tomography (DECT) and iterative metal artifact reduction (iMAR) algorithms are valuable tools for reducing metal artifacts. Different parameters of these technologies and their combination can achieve different performance. This study compared various polychromatic and monochromatic images obtained via DECT with and without using iMAR algorithm to reduce artifacts in patients with dental implants.

[Boundary threshold value method used in crystalline material internal defect detection by short wavelength X-ray diffraction].

There are few references about crystalline material internal defect detected by X-ray diffraction tomography using common X-ray source. Short wavelength X-ray diffractometer (SWXRD), invented by Institute of Southwest Technology Engineering, is a relatively small and inexpensive instrument compared to synchrotron radiation or neutron reactor. Boundary determination of defect affects the imaging quality and the distinguishing of defect in X-ray diffraction tomography using SWXRD.