Automation of an atomic force microscope via Arduino.

The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid substrates. They are expensive, in the half million dollar range for standard units, and therefore it is often difficult to upgrade to new units with improved characteristics.

An experimental/theoretical method to measure the capacitive compactness of an aqueous electrolyte surrounding a spherical charged colloid.

The capacitive compactness has been introduced very recently [G. I. Guerrero-García et al.

Impact of the collective diffusion of charged nanoparticles in the convective/capillary deposition directed by receding contact lines.

The motion of electrically charged particles under crowding conditions and subjected to evaporation-driven capillary flow might be ruled by collective diffusion. The concentration gradient developed inside an evaporating drop of colloidal suspension may reduce by diffusion the number of particles transported toward the contact line by convection. Unlike self-diffusion coefficient, the cooperative diffusion coefficient of interacting particles becomes more pronounced in crowded environments.