Quantitative Cathodoluminescence Mapping: A CdMgSeTe Thin-Film Case Study.

Full-spectrum cathodoluminescence (CL) mapping provides a point-by-point spatial measurement of the apparent band gap of a semiconductor thin film. In most studies, analysis of the electrical film properties from CL is presented as color mapping images. We have developed a spectra data analysis algorithm to functionalize, analyze, and generate statistical measurements of the luminescence data to provide additional insights.