Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper.

This work demonstrates the utility of synchrotron infrared reflectance microspectroscopy in the far- and mid-IR for the determination of the composition of electrogenerated surface films formed during the general and localized corrosion of copper in alkaline and bicarbonate solutions. Back-reflection geometry has been employed to identify the anodic film formed on copper in 0.1 M NaOH solution at 0.

In situ synchrotron far-infrared spectromicroscopy of a copper electrode at grazing incidence angle.

Synchrotron far-infrared spectroscopy in situ was successfully carried out on a copper microelectrode using a grazing-angle objective attached to a Bruker IRscope II microscope. The thin-layer spectroelectrochemical cell was constructed out of Teflon and fitted with a 20 microm-thick Mylar window; the copper electrode was 500 microm in diameter. Measurements were carried out in 0.