In classical interferometric null test measurements, the measurement and reference beam path should be the same. A difference in the beam paths results in the so called retrace error. One very common approach to avoid retrace errors is to adapt the measurement wavefront to the reference wavefront with a computer generated hologram (CGH), which is costly and time consuming.
View Article and Find Full Text PDFMicrostructuring techniques, such as laser direct writing, enable the integration of microstructures into conventional polymer lens systems and may be used to generate advanced functionality. Hybrid polymer lenses combining multiple functions such as diffraction and refraction in a single component become possible. In this paper, a process chain to enable encapsulated and aligned optical systems with advanced functionality in a cost-efficient way is presented.
View Article and Find Full Text PDFInterferometric determination of sphere radii is a well known technique. To keep accuracy high and uncertainties low, a precisely controlled environment is usually necessary. Environmental changes in temperature lead to time dependent drift in important measurement parameters and to disturbed results.
View Article and Find Full Text PDFWhen measuring surfaces it is always a challenge to differentiate whether differences to the expected form originate from positioning errors or from surface errors. In interferometry it is common to subtract tilt and power terms from the measurement result to remove misalignment contributions. This is a suitable approximation for spherical surfaces with small NA.
View Article and Find Full Text PDFWe present the intracavity generation of beams with radial polarization at an average output power of 750 W and an optical efficiency of 43% from a continuous wave thin-disk laser. Circular grating waveguide output couplers (GWOC) were used to select the radial polarization. The sensitivity of the polarizing function of the GWOC with regards to the fabrication tolerances is also analysed in details with a particular emphasis on the effect of the duty cycle and the geometrical profile of the gratings.
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