Publications by authors named "C Albonetti"

Article Synopsis
  • In this study, researchers highlight the importance of accurately measuring the relative dielectric constant of organic semiconductor films instead of assuming standard values.
  • Two techniques, Spectroscopy Ellipsometry and Scanning Capacitance Microscopy, were used to analyze the dielectric behavior of ultrathin films made of a specific organic compound.
  • The findings reveal that the dielectric constant varies with film thickness—starting at 2.1 for a single layer and reaching a maximum of 3.2 between the third and fourth layer—indicating a change in growth mode and molecular structure as the film thickens.
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Star copolymer films were produced by using spin-coating, drop-casting, and casting deposition techniques, thus obtaining ultrathin and thick films, respectively. The morphology is generally flat, but it becomes substrate-dependent for ultrathin films where the planarization effect of films is not efficient. The indentation hardness of films was investigated by Force Volume Maps in both the air and liquid.

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Among solution-processable metal oxides, zinc oxide (ZnO) nanoparticle inks are widely used in inverted organic solar cells for the preparation, at relatively low temperatures (<120 °C), of highly efficient electron-transporting layers. There is, however, a recent interest to develop more sustainable and less impacting methods/strategies for the preparation of ZnO NPs with controlled properties and improved performance. To this end, we report here the synthesis and characterization of ZnO NPs obtained using alternative reaction solvents derived from renewable or recycled sources.

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The physico-chemical properties of native oxide layers, spontaneously forming on crystalline Si wafers in air, can be strictly correlated to the dopant type and doping level. In particular, our investigations focused on oxide layers formed upon air exposure in a clean room after Si wafer production, with dopant concentration levels from ≈10 to ≈10 cm. In order to determine these correlations, we studied the surface, the oxide bulk, and its interface with Si.

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The morphology of sub-monolayer sexithiophene films has been investigated in situ and ex situ as a function of the substrate temperature of deposition. In this thickness range, monolayer terraces formed of edge-on molecules, i.e.

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