Label free detection of multiple trace antibiotics with SERS substrates and independent components analysis.

Surface enhanced Raman spectroscopy (SERS) has been widely studied and recognized as a powerful label-free technique for trace chemical analysis. However, its drawback in simultaneously identifying several molecular species has greatly limited its real-world applications. In this work, we reported a combination between SERS and independent component analysis (ICA) to detect several trace antibiotics which are commonly used in aquacultures, including malachite green, furazolidone, furaltadone hydrochloride, nitrofurantoin, and nitrofurazone.

Influence of an Annealing Temperature in a Vacuum Atmosphere on the Physical Properties of Indium Tin Oxide Nanorod Films.

In the present study, indium tin oxide (ITO) nanorod films were produced by usage of ion-assisted electron-beam evaporation with a glancing angle deposition technique. The as-produced ITO nanorod films were annealed in the temperature range of 100-500 °C for two hours in a vacuum atmosphere. The as-produced ITO nanorod films exhibited (222) and (611) preferred orientations from the X-ray diffraction pattern.

Influence of Annealing Temperature on Mechanical and Wetting Properties of -FeSi₂ Films Built Using Facing-Targets Direct-Current Sputtering.

In this research, -FeSi₂ films were formed on Si(111) wafer substrates via the utilization of facingtargets direct-current sputtering (FTDCS). The sputtering pressure was set at 1.33×10 Pa and the substrate temperature was maintained at 600 °C.

Effect of Annealing on Surface Morphology and Wettability of NC-FeSi₂ Films Produced via Facing-Target Direct-Current Sputtering.

Nanocrystalline iron disilicide (NC-FeSi₂) films were created at room temperature by facing-target direct current sputtering. The NC-FeSi₂ films were annealed at different temperatures of 300 °C, 600 °C, and 900 °C under high vacuum for 2 hours. XRD results of the as-created NC-FeSi₂ films after annealing at 300 °C showed a broad peak at 2 ranging from 40° to 50°.

Study of Annealing Influence on Basic Properties of Indium Tin Oxide Nanorod Films Deposited Using Glancing Angle Ion-Assisted Electron Beam Evaporation.

Indium tin oxide (ITO) nanorod films were deposited onto glass slides and Si wafers using ionassisted electron beam evaporation with a glancing angle deposition technique. The annealing influence on the basic properties of the as-deposited ITO nanorod films was studied in the range of 100-500 °C for two hours in air. The crystallinity of the ITO nanorod films was enhanced with the increasing annealing temperature, and the average transmission of the as-deposited ITO nanorod films in the visible range was 90%.