High-throughput sequential excitation for nanoscale mapping of electrochemical strain in granular ceria.

Dynamic strain based atomic force microscopy (AFM) modes often fail at the interfaces where the most interesting physics occurs because of their incapability of tracking contact resonance accurately under rough topography. To overcome this difficulty, we develop a high-throughput sequential excitation AFM that captures contact dynamics of probe-sample interactions with high fidelity and efficiency, acquiring the spectrum of data on each pixel over a range of frequencies that are excited in a sequential manner. Using electrochemically active granular ceria as an example, we map both linear and quadratic electrochemical strain accurately across grain boundaries with high spatial resolution where the conventional approach fails.