Publications by authors named "Brian E Faulkner"

Bending tests with atomic force microscopes (AFM) is a common method for elasticity measurements on 1D nanomaterials. Interpretation of the force and deflection data is necessary to determine the Young's modulus of the tested material and has been done assuming either of two classic boundary conditions that represent two extreme possibilities for the rigidity of the sample-anchor interface. The elasticity results from the two boundary conditions differ by a factor of four.

View Article and Find Full Text PDF