A NOVEL APPROACH FOR EFFECTIVE DOSE MEASUREMENTS IN DUAL-ENERGY CT.

A novel method was presented for the effective dose (ED) measurement with metal-oxide-semiconductor field-effect transistor (MOSFET) detectors in dual-energy (DE) dual-source (DS) computed tomography (CT) scanner. This study demonstrated that the mean energy of the combined spectrum in dual-source computed tomography can be used to measure the ED. For validation, the MOSFET dose at the centre cavity of a CT dose index (CTDI) body phantom was compared with the dose measured with an energy-independent ion chamber (IC).