Commercial photon-counting modules based on actively quenched solid-state avalanche photodiode sensors are used in a wide variety of applications. Manufacturers characterize their detectors by specifying a small set of parameters, such as detection efficiency, dead time, dark counts rate, afterpulsing probability and single-photon arrival-time resolution (jitter). However, they usually do not specify the range of conditions over which these parameters are constant or present a sufficient description of the characterization process.
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