At-focus scanning ptychography for high resolution imaging with a wide field of view.

From manufacturing to medicine, there is a demand for phase-resolved, high resolution imaging of large samples. Here we present at-focus scanning ptychography (AFSP), a novel ptychographic metrology station designed for high resolution imaging over a large field of view. AFSP builds on scanning ptychography, but samples remain stationary during the imaging process, allowing for in-situ imaging.

Single-pulse, reference-free, spatiotemporal characterization of ultrafast laser pulse beams via broadband ptychography.

Ultrafast laser pulse beams are four-dimensional, space-time phenomena that can exhibit complicated, coupled spatial and temporal profiles. Tailoring the spatiotemporal profile of an ultrafast pulse beam is necessary to optimize the focused intensity and to engineer exotic spatiotemporally shaped pulse beams. Here we demonstrate a single-pulse, reference-free spatiotemporal characterization technique based on two colocated synchronized measurements: (1) broadband single-shot ptychography and (2) single-shot frequency resolved optical gating.

Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography.

Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, ~(,,,), can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase.