Optical near-field data analysis through time-frequency distributions: application to the characterization and separation of the image spectral content by reassignment.

The near-field optical images have been traditionally analyzed by Fourier analysis and, recently, by wavelet analysis. Those data are nonstationary, which means that their spectral content varies with time, owing to the scanning-probe recording process; therefore time-frequency representations are, potentially, powerful tools for local characteristics extraction or shape separation, since they distribute the energy of the analyzed signal over the time and frequency variables and faithfully depict the signal local behavior. In this study we show that Cohen's class time-frequency distributions and their modified version by the reassignment method are appropriate tools for the analysis of near-field optical data.

Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: characterization with a spline and Fourier spectrum.

Scanning near-field optical microscopes (SNOM's) actually lead to nanometric lateral resolution. A combination with shear-force feedback is sometimes used to keep the SNOM tip at a constant force from the sample. However, resolutions in shear-force and optical data are different.