Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.
View Article and Find Full Text PDFAt the French synchrotron facility SOLEIL, a new X-ray imaging facility PUMA (Photons Utilisés pour les Matériaux Anciens) has been made available to scientific communities studying materials from cultural heritage. This new instrument aims to achieve 2D and 3D imaging with microscopic resolution, applying different analytical techniques including X-ray fluorescence spectroscopy (XRF), X-ray absorption spectroscopy (XAS), X-ray diffraction and phase-contrast imaging. In order to discover its capabilities a detailed analytical characterization of this beamline as an analytical and imaging tool is deemed necessary.
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