Low-cost scheme for high-precision dual-wavelength laser metrology.

A method capable of delivering relative optical path length metrology with nanometer precision is demonstrated. Unlike conventional dual-wavelength metrology, which employs heterodyne detection, the method developed in this work utilizes direct detection of interference fringes of two He-Ne lasers as well as a less precise stepper motor open-loop position control system to perform its measurement. Although the method may be applicable to a variety of circumstances, the specific application in which this metrology is essential is in an astrometric optical long baseline stellar interferometer dedicated to precise measurement of stellar positions.