Zinc Oxide thin films at room temperature with good crystallinity quality have been deposited at different Radio Frequency powers. Magnetron sputtering technique has been carried out on glass and oriented Si(100) substrates. The film structure has been characterized by X-ray Diffraction (XRD) and MicroRaman spectroscopy, which possesses a wurtzite structure with (002) preferential orientation selecting suitable conditions.
View Article and Find Full Text PDFA general method is proposed to model 3D microstructures representative of three-phases anode layers used in fuel cells. The models are based on SEM images of cells with varying morphologies. The materials are first characterized using three morphological measurements: (cross-)covariances, granulometry and linear erosion.
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