Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties.

One of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and thermal properties. Measuring local current flow is one of the very important methods of evaluation for, for instance, photovoltaic materials or semiconductor structures and other nanodevices.

Atomic force microscopy in mechanical measurements of single nanowires.

In this paper, we present the results of mechanical measurement of single nanowires (NWs) in a repeatable manner. Substrates with specifically designed mechanical features were used for NW placement and localization for measurements of properties such as Young's modulus or tensile strength of NW with an atomic force microscopy (AFM) system. Dense arrays of zinc oxide (ZnO) nanowires were obtained by one-step anodic oxidation of metallic Zn foil in a sodium bicarbonate electrolyte and thermal post-treatment.

Wavelet-based information theory in quantitative assessment of AFM images' quality.

The quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon's application of information theory for measuring image quality. Specifically, we propose quantifying the loss of image information due to the various distortion processes by exploring the relationship between image information based on the information channel capacity (ICC), spectral image representation, and visual quality.

Four-Point Measurement Setup for Correlative Microscopy of Nanowires.

The measurement method, which utilizes nanomanipulation of the nanowires onto a specially prepared substrate, was presented. It introduced a four-point resistance measurement setup on a chip suited for scanning probe microscopy measurements, integrating connectors and a nanowire specimen. A study on the resistance and resistivity of the thermally post-treated ZnO nanowires at 200 °C and 300 °C in air showed the dependence of these electrical parameters on the annealing temperature.

Correlation between Friction and Wear in Cylindrical Anchorages Simulated with Wear Machine and Analyzed with Scanning Probe and Electron Microscope.

This paper presents the possibilities of applying atomic force microscopy (AFM) techniques to the study of the wear of prosthetic biomaterials. In the conducted research, a zirconium oxide sphere was used as a test piece for mashing, which was moved over the surface of selected biomaterials: polyether ether ketone (PEEK) and dental gold alloy (Degulor M). The process was carried out with constant load force in an artificial saliva environment (Mucinox).

Microcantilever-based current balance for precise measurement of the photon force.

We present a method for the quantitative determination of the photon force (PF)-the force generated by the radiation pressure of photons reflected from the surface. We propose an experimental setup integrating innovative microelectromechanical system (MEMS) optimized for the detection of photon force (pfMEMS). An active microcantilever was used as the force detector, while the measurement was conducted in a closed-loop setup with electromagnetic force compensation.