A scanning tunneling microscopy study of a new superstructure around defects created by tip-sample interaction on 2H- NbSe(2).

A low temperature scanning tunneling microscope (LT-STM) was used to investigate a new superstructure on the cleaved surface of a 2H- NbSe(2) single crystal after introduction of structural defects through bias voltage pulses during tunneling at 4.2 K. A charge density wave (CDW) with a [Formula: see text] reconstruction was observed in the vicinity of the defects and the well-known 3 × 3 CDW was observed far from these defects.