Polarity-Induced Selective Area Epitaxy of GaN Nanowires.

We present a conceptually novel approach to achieve selective area epitaxy of GaN nanowires. The approach is based on the fact that these nanostructures do not form in plasma-assisted molecular beam epitaxy on structurally and chemically uniform cation-polar substrates. By in situ depositing and nitridating Si on a Ga-polar GaN film, we locally reverse the polarity to induce the selective area epitaxy of N-polar GaN nanowires.

Correlation between the structural and optical properties of spontaneously formed GaN nanowires: a quantitative evaluation of the impact of nanowire coalescence.

We investigate the structural and optical properties of spontaneously formed GaN nanowires with different degrees of coalescence. This quantity is determined by an analysis of the cross-sectional area and perimeter of the nanowires obtained by plan-view scanning electron microscopy. X-ray diffraction experiments are used to measure the inhomogeneous strain in the nanowire ensembles as well as the orientational distribution of the nanowires.

GaAs-Fe₃Si core-shell nanowires: nanobar magnets.

Semiconductor-ferromagnet GaAs-Fe3Si core-shell nanowires were grown by molecular beam epitaxy and analyzed by scanning and transmission electron microscopy, X-ray diffraction, Mössbauer spectroscopy, and magnetic force microscopy. We obtained closed and smooth Fe3Si shells with a crystalline structure that show ferromagnetic properties with magnetizations along the nanowire axis (perpendicular to the substrate). Such nanobar magnets are promising candidates to enable the fabrication of new forward-looking devices in the field of spintronics and magnetic recording.

Macro- and micro-strain in GaN nanowires on Si(111).

We analyze the strain state of GaN nanowire ensembles by x-ray diffraction. The nanowires are grown by molecular beam epitaxy on a Si(111) substrate in a self-organized manner. On a macroscopic scale, the nanowires are found to be free of strain.

Kinetic optimum of volmer-weber growth.

We find that the molecular beam epitaxy of Fe3Si on GaAs(001) observed by real-time x-ray diffraction begins by the abrupt formation of 3 monolayer (ML) high islands and approaches two-dimensional layer-by-layer growth at a thickness of 7 ML. A surface energy increase is confirmed by ab initio calculations and allows us to identify the growth as a strain-free Volmer-Weber transient. Kinetic Monte Carlo simulations incorporating this energy increase correctly reproduce the characteristic x-ray intensity oscillations found in the experiment.