Trends, characteristics, and outcomes of pregnancy in women with attention-deficit hyperactivity disorder: A nationwide analysis.

Objective: To assess clinical and obstetric characteristics associated with pregnant patients with a diagnosis of attention-deficit hyperactivity disorder (ADHD).

Methods: This serial cross-sectional study queried the Agency of Healthcare Research and Quality's Healthcare Cost and Utilization Project National Inpatient Sample. The study population was 16,759,786 hospital deliveries from 2016 to 2020.

eEF-2K Deficiency Boosts the Virus-Specific Effector CD8 T Cell Responses During Viral Infection.

In this study, we revealed a critical role of eukaryotic elongation factor-2 kinase (eEF-2K), a negative regulator of protein synthesis, in regulating T cells during vaccinia virus (VACV) infection. We found that eEF-2K-deficient (eEF-2K⁻/⁻) mice exhibited a significantly higher proportion of VACV-specific effector CD8 T cells without compromising the development of VACV-specific memory CD8 T cells. RNA sequencing demonstrated that eEF-2K⁻/⁻ VACV-specific effector CD8 T cells had enhanced functionality, which improves their capacity to combat viral infection during the effector phase.

Diagnosis of Reverse-Connection Defects in High-Voltage Cable Cross-Bonded Grounding System Based on ARO-SVM.

High-voltage (HV) cables are increasingly used in urban power grids, and their safe operation is critical to grid stability. Previous studies have analyzed various defects, including the open circuit in the sheath loop, the flooding in the cross-bonded link box, and the sheath grounding fault. However, there is a paucity of research on the defect of the reverse direction between the inner core and the outer shield of the coaxial cable.

Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction.

The failure of different chips under working conditions is influenced by various stress states such as different voltages, temperatures, stress durations, and stress variations. Therefore, the failure time has a great degree of dispersion, and similar chips may exhibit different failure mechanisms due to variations in their working environments. This paper proposes three system-on-chip reliability failure prediction unit circuits: the time-dependent dielectric breakdown prediction circuit, the negative bias temperature instability prediction circuit, and the hot carrier injection prediction circuit.