Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials.

We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies.

Single and multilayer metamaterials fabricated by nanoimprint lithography.

We demonstrate for the first time a fast and easy nanoimprint lithography (NIL) based stacking process of negative index structures like fishnet and Swiss-cross metamaterials. The process takes a few seconds, is cheap and produces three-dimensional (3D) negative index materials (NIMs) on a large area which is suitable for mass production. It can be performed on all common substrates even on flexible plastic foils.

Method of calculating local dispersion in arbitrary photonic crystal waveguides.

We introduce a novel method to calculate the local dispersion relation in photonic crystal waveguides, based on the finite-difference time-domain simulation and filter diagonalization method (FDM). In comparison with the spatial Fourier transform method (SFT), the highly local dispersion calculations based on FDM are considerably superior and pronounced. For the first time to our knowledge, the presented numerical technique allows comparing the dispersion in straight and bent waveguides.