Nanostructure-Dependent Electrical Conductivity Model Within the Framework of the Generalized Effective Medium Theory Applied to Poly(3-hexyl)thiophene Thin Films.

One of the key parameters characterizing the microstructure of a layer is its degree of order. It can be determined from optical studies or X-ray diffraction. However, both of these methods applied to the same layer may give different results because, for example, aggregates may contribute to the amorphous background in XRD studies, while in optical studies, they may already show order.