Publications by authors named "Atef M Rashed"
Article Synopsis
- - Ellipsometry was employed to analyze how light interacts with a thin film of CH3NH3PbI3 (MAPI), an organic-inorganic hybrid perovskite, on a silicon wafer.
- - The study measured the amplitude ratio and phase shift of the light, which helps understand the optical properties of the material.
- - A multi-oscillator model was used to determine the refractive index and extinction coefficient across a wavelength range of 300 to 1500 nm from the collected data.
