Publications by authors named "Ashwin K Rishinaramagalam"
Article Synopsis
- Imaging high-aspect-ratio nanostructures using atomic force microscopy (AFM) has been difficult because most commercial tips are not suitable due to their mechanical properties and shape.
- This study presents the development of Gallium Nitride (GaN) probes that are specifically designed for better resolution and durability when measuring these complex structures.
- The GaN probes, created through both bottom-up and top-down methods and attached to silicon cantilevers, performed well in scanning uneven surfaces, offering improved image quality and longevity over typical silicon tips.
