Quantum-size-controlled photoelectrochemical fabrication of epitaxial InGaN quantum dots.

We demonstrate a new route to the precision fabrication of epitaxial semiconductor nanostructures in the sub-10 nm size regime: quantum-size-controlled photoelectrochemical (QSC-PEC) etching. We show that quantum dots (QDs) can be QSC-PEC-etched from epitaxial InGaN thin films using narrowband laser photoexcitation, and that the QD sizes (and hence bandgaps and photoluminescence wavelengths) are determined by the photoexcitation wavelength. Low-temperature photoluminescence from ensembles of such QDs have peak wavelengths that can be tunably blue shifted by 35 nm (from 440 to 405 nm) and have line widths that narrow by 3 times (from 19 to 6 nm).

Gallium nitride based logpile photonic crystals.

We demonstrate a nine-layer logpile three-dimensional photonic crystal (3DPC) composed of single crystalline gallium nitride (GaN) nanorods, ∼100 nm in size with lattice constants of 260, 280, and 300 nm with photonic band gap in the visible region. This unique GaN structure is created through a combined approach of a layer-by-layer template fabrication technique and selective metal organic chemical vapor deposition (MOCVD). These GaN 3DPC exhibit a stacking direction band gap characterized by strong optical reflectance between 380 and 500 nm.

Silicon-based near-visible logpile photonic crystal.

A nanocavity structure is embedded inside a silicon logpile photonic crystal that demonstrates tunable absorption behavior at near visible wavelengths well beyond the absorption edge of silicon. This is due to silicon’s indirect bandgap resulting in a relatively slow increase in the absorption of silicon with decreasing wavelength. Our results open up the possibility of utilizing the wide, complete three dimensional photonic gap enabled by the large refractive index of silicon to create three dimensional photonic crystal based devices well into the visible regime.