A mass defect-based approach for the automatic construction of peak lists for databases of mass spectra with limited resolution: Application to time-of-flight secondary ion mass spectrometry data.

Rationale: This study has developed a data processing protocol based on mass defect analysis for the automatic construction of unique peak lists addressing the need for the fast and efficient treatment of databases of mass spectra with limited mass resolution.

Methods: The data processing protocol, implemented in MATLAB, is tested on a database of 126 mass spectra obtained from time-of-flight secondary ion mass spectrometry analysis of the exhaust of a laboratory diesel miniCAST burner deposited on Ti substrates.

Results: The data processing protocol converts the mass spectra into a data matrix suitable for chemometrics (peak list) by combining mass defect analysis and multivariate analysis.