EBIC and luminescence studies of defects in solar cells.

Electron beam-induced current (EBIC) can be used to detect electronic irregularities in solar cells, such as shunts and precipitates, and to perform physical characterization of defects by, e.g. measuring the temperature dependence of their recombination activity.

Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics.

Well-controlled fabrication of dislocation networks in Si using direct wafer bonding opens broad possibilities for nanotechnology applications. Concepts of dislocation-network-based light emitters, manipulators of biomolecules, gettering and insulating layers, and three-dimensional buried conductive channels are presented and discussed. A prototype of a Si-based light emitter working at a wavelength of about 1.