Single-photon detectors based on avalanche photodiodes (SPADs) are key elements of many modern highly sensitive optical systems. One of the bottlenecks of such detectors is an afterpulsing effect, which limits detection rate and requires an optimal hold-off time. In this paper, we propose a novel approach for statistical analysis of SPAD dark counts, and we demonstrate its usefulness for the search of the experimental condition where the afterpulsing effect can be strongly eliminated.
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