Ghost polarimetry using Stokes correlations.

We present here a novel ghost polarimeter based on Stokes parameter correlations and a spatially incoherent classical source with adjustable polarization state and Gaussian statistics. The setup enables extracting the four amplitudes and three phase differences related to the spectral $ 2 \times 2 $2×2 complex Jones matrix of any transmissive polarization-sensitive object. Our work extends the ghost imaging methods from the traditional intensity correlation measurements to the detection of polarization state correlations.

Classical ghost-imaging spectral ellipsometer.

We introduce a novel approach for the spectral characterization of inhomogeneous thin films and interfaces by means of an imaging ghost ellipsometer operating with classical light of Gaussian statistics. We show that the device output in general provides the ellipsometric information associated with the fractional Fourier transforms of the sample's reflection coefficients, which in special cases reduce to the Fourier transforms or images. The formalisms for both one-dimensional and two-dimensional samples are presented.

Classical spectral ghost ellipsometry.

We introduce a novel ghost reflection ellipsometer for a spectral characterization of homogeneous thin films and interfaces. The device makes use of a uniform, spatially incoherent, unpolarized light source with Gaussian statistics and of the detection of intensity correlations. Unlike traditional ellipsometers, no source or detector calibration and reference sample are needed.