X-ray fluorescent method for the analysis of trace elements in bio-materials with correction of the matrix effect.

A method for correcting the matrix effect by measuring the intensity of fluorescent radiation and its absorption by the sample material in the same x-ray optical scheme is proposed. The use of a complex secondary Ag-Ge emitter as a primary radiation source provides a low detection limit for a wide range of chemical elements from Ca (Z = 20) to Mo (Z = 42) in the K-series and from Cd (Z = 48) to Bi (Z = 83) in the L-series. To measure the absorption, the radiation of an additional secondary emitter is used, of which the wavelength can be varied in the range from 0.

Method for determining the electronegativity of bound atoms of chemical elements with a small atomic number.

The classical approach of James and Brindley for determining the shielding of a nucleus by electrons from the atomic form factor of the scattering of x rays is generalized for atoms in a bound state. It is shown that for chemical elements with atomic number Z < 10, the ratio of the peaks of coherent IR and incoherent IC scattering in the range of (sin θ)/λ from 0.7 to 2.

Determination of the figurative point trajectory on the phase diagram of NiO lithiation-oxidation process by x-ray diffraction and Compton scattering methods.

The positions of the figurative points on the triangular Gibbs phase diagram for the process of high-temperature synthesis of solid solutions LiNiO were determined for the first time using a combination of x-ray diffraction (XRD) and Compton scattering methods. The trajectory of the figurative point is built according to experimental data for temperatures of 650 and 750 °C. The ratios of the phases in equilibrium are found.