We developed a technique that enables replacement of a metallic waveguide cladding with a low-index (n≈1.4) material - CaF or BaF. It is transparent from the mid-IR up to the visible range: elevated confinement is preserved while introducing an optical entryway through the substrate.
View Article and Find Full Text PDFWe have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis.
View Article and Find Full Text PDFTotal internal reflection microscopy is mainly used in its fluorescence mode and is the reference technique to image fluorescent proteins in the vicinity of cell membranes. Here, we show that this technique can easily become a phase microscope by simply detecting the coherent signal resulting from the interference between the field scattered by the probed sample and the total internal reflection. Moreover, combining several illumination angles permits generating synthetic aperture reconstructions with improved resolutions compared to standard label-free microscopy techniques.
View Article and Find Full Text PDFJ Opt Soc Am A Opt Image Sci Vis
February 2015
Tomographic diffractive microscopy is a three-dimensional imaging technique that reconstructs the permittivity map of the probed sample from its scattered field, measured both in phase and in amplitude. Here, we detail how polarization-resolved measurements permit us to significantly improve the accuracy and the resolution of the reconstructions, compared to the conventional scalar treatments used so far. An isotropic transverse resolution of about 100 nm at a wavelength of 475 nm is demonstrated using this approach.
View Article and Find Full Text PDFOxide-free bonding of a III-V active stack emitting at 1300-1600 nm to a silicon-on-insulator wafer offers the capability to electrically inject lasers from the silicon side. However, a typical 500-nm-thick silicon layer notably attracts the fundamental guided mode of the silicon + III-V stack, a detrimental feature compared to established III-V Separate-Confinement Heterostructure (SCH) stacks. We experimentally probe with photoluminescence as an internal light source the guiding behavior for oxide-free bonding to a nanopatterned silicon wafer that acts as a low-index barrier.
View Article and Find Full Text PDFJ Opt Soc Am A Opt Image Sci Vis
October 2013
Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.
View Article and Find Full Text PDFWe have developed surface-emitting single-mode quantum cascade lasers which employ high-contrast photonic-crystal resonators. The devices operate on band-edge states of the photonic band-structure. The mode profile and polarization characteristics of the band-edge modes are calculated by three-dimensional finite-difference time-domain simulation.
View Article and Find Full Text PDFThe interferogram of a high index phase mask of 200 nm period under normal incidence of a collimated beam at 244 nm wavelength with substantially suppressed zeroth order produces a 100 nm period grating in a resist film under immersion. The paper describes the phase mask design, its fabrication, the effect of electron-beam lithographic stitching errors and optical assessment of the fabricated sub-cutoff grating.
View Article and Find Full Text PDFWe investigated the impact of electron-beam lithography writing imperfections on the performance of two-dimensional resonant grating notch filters. This large area photonic device provides an interesting benchmark to assess the acceptable limits of unavoidable fabrication errors. We found that field stitching errors up to 100 nm have no detrimental effect on the filter linewidth, whereas a 2.
View Article and Find Full Text PDFOptical diffraction tomography (ODT) is a recent imaging technique that combines the experimental methods of phase microscopy and synthetic aperture with the mathematical tools of inverse scattering theory. We show experimentally that this approach permits us to obtain the map of permittivity of highly scattering samples with axial and transverse resolutions that are much better than that of a microscope with the same numerical aperture.
View Article and Find Full Text PDFJ Opt Soc Am A Opt Image Sci Vis
March 2009
The peaks in the reflectivity spectrum of waveguide gratings observed when the incident beam couples to a mode of the structure are promising features for many applications. However their weak angular tolerance and their strong polarization sensitivity, especially under oblique incidence, limit their interest in practice. These problems can be overcome by forming slow degenerate modes outside the usual high symmetry points of the Brillouin zone with a complex periodic pattern [Fehrembach, Appl.
View Article and Find Full Text PDFResonant grating filters are promising components for free-space narrowband filtering. Unfortunately, due to their weak angular tolerance, their performances are strongly deteriorated when they are illuminated with a standard collimated beam. Yet this problem can be overcome by resorting to a complex periodic pattern known as the doubly periodic grating [Lemarchand et al.
View Article and Find Full Text PDFWe report on reflection modulation results near 1.55 mum in InP-based two-dimensional photonic crystals. The fabrication technology uses a polymeric bonding technique to integrate the InP thin-slab onto a Silicon wafer.
View Article and Find Full Text PDFThe group index dispersion and birefringence of guided modes supported by straight photonic crystal (PhC) waveguides are theoretically and experimentally investigated as a function of the waveguide width within various reduced frequency domains. Within the photonic gap and far from the Brillouin zone edges, strongly confined modes supported by narrow PhC guides exhibit both a group index and a birefringence larger than those of a deep ridge. These two results evidence the contribution of the photonic gap to the guiding mechanism in the refractivelike domain.
View Article and Find Full Text PDFHigh resolution images of planar photonic crystal (PC) optical components fabricated by e-beam lithography in various materials are analyzed to characterize statistical properties of common 2D geometrical imperfections. Our motivation is to attempt an intuitive, while rigorous statistical description of fabrication imperfections to provide a realistic input into theoretical modelling of PC device performance.
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