A novel Alzheimer detection rapid-testing low-cost technique by a gate engineered gate stack dual-gate FET device.

This study explores a quick, low-cost method to detect Alzheimer's disease (AD) by evaluating the accomplishment of a Gate-Stack (GS) Field Effect Transistor (FET). We investigate Single-Metal (SM), Dual-Metal (DM), and Tri-Metal Double Gate (DG) configurations, where cavities have been created by etching the oxide layer underneath the gate to immobilize grey matter samples collected through Solid-phase microextraction (SPME). Healthy and AD-affected grey matter have different dielectric characteristics at high frequencies.

A Novel Liver Cancer POC Diagnostic Detection Technique by a Gate-engineered Source-extended TFET Device.

This work reports a novel POC diagnostic technique to identify the cancerous liver cell lines by designing a Source-Extended (SE) Tunnel Field Effect Transistor (TFET) having a Single-Gate (SG) with Single-Metal (SM) and Dual-Metal (DM) structure. The proposed structures have been equipped with nanocavities by trenching the gate oxide layer where the needle biopsy obtained liver sample has been immobilized. The detection is based on the difference in drain current and the ratio of the proposed device's ON and OFF state currents, which has been evaluated by obtaining the sensitivities.