Radiation effects in solid nitrogen and nitrogen-containing matrices: fingerprints of N₄⁺ species.

The radiation effects and relaxation processes in solid N2 and N2-doped Ne matrices, preirradiated by an electron beam, have been studied in the temperature range of 5-40 and 5-15 K, respectively. The study was performed using luminescence methods: cathodoluminescence CL and developed by our group nonstationary luminescence NsL, as well as optical and current activation spectroscopy methods: spectrally resolved thermally stimulated luminescence TSL and exoelectron emission TSEE. An appreciable accumulation of N radicals, N(+), N2(+) ions, and trapped electrons is found in nitrogen-containing Ne matrices.