Application of Single-Frequency Arbitrarily Directed Split Beam Metasurface Reflector in Refractive Index Measurements.

We present a sensor that utilizes a modified single-frequency split beam metasurface reflector to measure the refractive index of materials ranging from one to three. Samples are placed into a cavity between a PCB-etched dielectric and a reflecting ground plane. It is illuminated using a 10.