EBIT Observation of Ar Dielectronic Recombination Lines near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters.

Motivated by possible atomic origins of the unidentified emission line detected at 3.55-3.57 keV in a stacked spectrum of galaxy clusters, an electron beam ion trap (EBIT) was used to investigate the resonant dielectronic recombination (DR) process in highly charged argon ions as a possible contributor to the emission feature.