The method of lines extension for the analysis of multilayered graphene-loaded structures in cylindrical coordinates.

In this paper the extended method of lines (E-MoL) is proposed for the analysis of multilayer graphene-loaded three dimensional structures in cylindrical coordinates. Accordingly, the impedance and admittance matrices are defined as the ratios of the electric and magnetic fields at each plane of the stack. The impedance and admittance parameters are transformed from the input to the output of the structure through layers and interfaces, from which, the scattering parameters are extracted.

Method of lines for the analysis of tunable plasmonic devices composed of graphene-dielectric stack arrays.

Due to the increasing interest in emerging applications of graphene or other 2D material-based devices in photonics, a powerful, fast and accurate tool for the analysis of such structures is really in need. In this paper, the semi-analytical method of lines (MoL) is generalized for the diffraction analysis of tunable graphene-based plasmonic devices possessing three dimensional periodicity. We employ Floquet's theorem to handle analytically propagation of waves in the periodicity of the graphene-dielectric arrays in the direction of the layers stacking.