Publications by authors named "Alexey V Ershov"

X-ray and optical spectroscopies were applied in order to study the band structure and electronic excitations of the SiO /R O (R  =  Si, Al, Zr) suboxide superlattices. The complementary x-ray emission and absorption measurements allow for the band gap values for the SiO layers to be established, which are found to have almost no dependency on the cation type R. It is determined that, after annealing, the stoichiometric factor x remains near 1.

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Synopsis of recent research by authors named "Alexey V Ershov"

  • - Alexey V Ershov's research primarily focuses on the electronic properties of suboxide superlattices, specifically investigating the energy band gaps and excited states in silicon quantum dots embedded within silicon oxide and various metal oxide matrices (SiO/R O).
  • - Recent findings suggest that the band gap values in SiO layers are largely independent of the type of cation (R = Si, Al, Zr) used in the superlattice structure, highlighting the robustness of the material properties across different compositions.
  • - The study utilized advanced x-ray emission and absorption techniques to accurately measure these properties, revealing that post-annealing, the stoichiometric factor remains approximately constant, which is significant for the stability and applications of these materials.