Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography.

This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects.

Active IR Thermography Evaluation of Coating Thickness by Determining Apparent Thermal Effusivity.

Pulsed thermography is a common technique for nondestructive testing (NDT) of materials. This study presents the apparent effusivity method for the quantitative evaluation of coating thickness in a one-sided thermal NDT procedure. The proposed algorithm is based on determining a threshold value of apparent effusivity, which can be found for particular coating-on-substrate structures.