Publications by authors named "Alexander Tolstogouzov"

In the present study Ar cluster ions accelerated by voltages in the range of 5-10 kV are used to irradiate single crystal ZnO substrates and nanorods to fabricate self-assembled surface nanoripple arrays. The ripple formation is observed when the incidence angle of the cluster beam is in the range of 30-70°. The influence of incidence angle, accelerating voltage, and fluence on the ripple formation is studied.

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Rationale: Continuously downscaling integrated circuit devices requires fabrication of shallower p-n junctions. The ion implantation approach at low energy is subject to low beam current due to the Coulomb repulsion. To overcome this problem cluster ions can be used for implantation.

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Article Synopsis
  • The study used an Ar cluster ion beam to irradiate Si nanopowder targets, focusing on parameters like energy and dose.
  • Results showed that sputtering yield decreased with higher doses and target densities, with an unusual peak at 17.3 keV where yield was significantly greater than bulk Si.
  • The findings were attributed to a combination of finite size effects and debris formation impacting the sputtering process.
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Time-of-flight secondary ion mass spectrometry was used to study four human calculi and to compare the results with those from twelve commercially available urinary calculi minerals including three organic compounds (L-cystine, uric acid and sodium urate). Phase identification of calcium phosphate compounds was carried out by considering the relative ion abundances of [Ca(2)O](+) and [CaPO(2)](+). Deprotonated [M-H](-) and protonated [M+H](+) uric acid were detected and used for component recognition in pure uric acid and in the mixed samples of struvite, calcium oxalate and uric acid.

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Knudsen high-temperature mass spectrometry was used to study the process of sublimation of a solid electrolyte (AgI)(0.5-)(AgPO(3))(0.5).

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