Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials.

In focused ion beam (FIB) tomography, a combination of FIB with a scanning electron microscope (SEM) is used for collecting a series of planar images of the microstructure of nanoporous materials. These planar images serve as the basis for reconstructing the three-dimensional microstructure through segmentation algorithms. However, the assumption of a constant distance between consecutively imaged sections is generally invalid due to random variations in the FIB milling process.

Correction: Tantalum(v) 1,3-propanediolate β-diketonate solution as a precursor to sol-gel derived, metal oxide thin films.

[This corrects the article DOI: 10.1039/D0RA02558E.].

Tantalum(v) 1,3-propanediolate β-diketonate solution as a precursor to sol-gel derived, metal oxide thin films.

Tantalum oxide is ubiquitous in everyday life, from capacitors in electronics to ion conductors for electrochromic windows and electrochemical storage devices. Investigations into sol-gel deposition of tantalum oxide, and its sister niobium oxide, has accelerated since the 1980s and continues to this day. The aim of this study is to synthesize a near UV sensitive, air stable, and low toxicity tantalum sol-gel precursor solution for metal oxide thin films - these attributes promise to reduce manufacturing costs and allow for facile mass production.

Low-Temperature PLD-Growth of Ultrathin ZnO Nanowires by Using Zn Al O and Zn Ga O Seed Layers.

ZnO nanowires (NWs) are used as building blocks for a wide range of different devices, e.g. light emitters, resonators, and sensors.