A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T).
View Article and Find Full Text PDFThe mechanisms of orientation of columnar liquid crystals (LCs) on a PTFE-rubbed surface are explored on a homologous series of symmetrically substituted poly(di--alkylsiloxanes) (PDAS). It is shown that by increasing the side-chain length in steps of one CH group, the orientation of PDAS switches back and forth from perpendicular to parallel with respect to PTFE chains. These changes are sensitive to the smallest possible variation of the macromolecular structure (i.
View Article and Find Full Text PDF