The advanced development of optoelectronic devices requires a methodical knowledge of the fundamental material properties of the key active components. Systematic investigations and correlations of such basic optical properties can lead to new insights for the design of more potent materials. In this perspective, we provide a systematic overview of the uniaxial anisotropic complex refractive indices and the absorption coefficients obtained by ellipsometry as well as the optical band gap energies derived from Tauc plots of six selected solution-processed polymer thin films.
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