A method for calibrating the dynamic torsional spring constant of cantilevers by directly measuring the thermally driven motion of the cantilever with an interferometer is presented. Random errors in calibration were made negligible (<1%) by averaging over multiple measurements. The errors in accuracy of ±5% or ±10% for both of the cantilevers calibrated in this study were limited only by the accuracy of the laser Doppler vibrometer (LDV) used to measure thermal fluctuations.
View Article and Find Full Text PDFTapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable, and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use, quantification of tip-sample mechanical properties such as stiffness has remained elusive. Bimodal tapping mode keeps the advantages of single-frequency tapping mode while extending the technique by driving and measuring an additional resonant mode of the cantilever.
View Article and Find Full Text PDFBimodal atomic force microscopy uses a cantilever that is simultaneously driven at two of its eigenmodes (resonant modes). Parameters associated with both resonances can be measured and used to extract quantitative nanomechanical information about the sample surface. Driving the first eigenmode at a large amplitude and a higher eigenmode at a small amplitude simultaneously provides four independent observables that are sensitive to the tip-sample nanomechanical interaction parameters.
View Article and Find Full Text PDFA method is presented for calibrating the higher eigenmodes (resonant modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine a power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers.
View Article and Find Full Text PDFRev Sci Instrum
March 2016
An alternative method for power spectral density (PSD) estimation--the Daniell method--is revisited and compared to the most prevalent method used in the field of atomic force microscopy for quantifying cantilever thermal motion--the Bartlett method. Both methods are shown to underestimate the Q factor of a simple harmonic oscillator (SHO) by a predictable, and therefore correctable, amount in the absence of spurious deterministic noise sources. However, the Bartlett method is much more prone to spectral leakage which can obscure the thermal spectrum in the presence of deterministic noise.
View Article and Find Full Text PDFContact Resonance Force Microscopy (CR-FM) is a leading atomic force microscopy technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the "forest of peaks" frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal excitation results in clean contact, resonance spectra that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike.
View Article and Find Full Text PDFHere we report the bias-evolution of the electrical double layer structure of an ionic liquid on highly ordered pyrolytic graphite measured by atomic force microscopy. We observe reconfiguration under applied bias and the orientational transitions in the Stern layer. The synergy between molecular dynamics simulation and experiment provides a comprehensive picture of structural phenomena and long and short-range interactions, which improves our understanding of the mechanism of charge storage on a molecular level.
View Article and Find Full Text PDFWe present the first accurate damping profiles acquired in atomic-resolution hydration force spectroscopy, revealing a monotonic damping profile at the nanoscopic tip apex. Atomic resolution is confirmed by the observed inhomogeneity caused by random substitution of Si by Al on the mica surface, and two distinct damping regimes are identified. Damping only appears above our detection limit of 1 nNs/m once the tip interacts with the second hydration layer, and an onset of strong damping above 100 nNs/m appears upon direct interaction with the adsorbed layer and first hydration layer.
View Article and Find Full Text PDFHaving reached the quantum and thermodynamic limits of detection, atomic force microscopy (AFM) experiments are routinely being performed at the fundamental limit of signal to noise. A critical understanding of the statistical properties of noise leads to more accurate interpretation of data, optimization of experimental protocols, advancements in instrumentation, and new measurement techniques. Furthermore, accurate simulation of cantilever dynamics requires knowledge of stochastic behavior of the system, as stochastic noise may exceed the deterministic signals of interest, and even dominate the outcome of an experiment.
View Article and Find Full Text PDFIt is well known that the low-Q regime in dynamic atomic force microscopy is afflicted by instrumental artifacts (known as "the forest of peaks") caused by piezoacoustic excitation of the cantilever. In this article, we unveil additional issues associated with piezoacoustic excitation that become apparent and problematic at low Q values. We present the design of a photothermal excitation system that resolves these issues, and demonstrate its performance on force spectroscopy at the interface of gold and an ionic liquid with an overdamped cantilever (Q < 0.
View Article and Find Full Text PDFExtracting quantitative information from amplitude-modulation atomic force microscopy (AM-AFM) in viscous ionic liquids is difficult because existing theory requires knowledge of the cantilever natural frequency, which cannot be measured in the absence of a resonance peak. We present a new model that describes cantilever dynamics in an overdamped medium (Q < 0.5) and derive the theory necessary to extract the stiffness and damping in highly viscous liquids.
View Article and Find Full Text PDFIn atomic force microscopy, cantilevers with a reflective coating are often used to reduce optical shot noise for deflection detection. However, static AFM experiments can be limited by classical noise and therefore may not benefit from a reduction in shot noise. Furthermore, the cantilever coating has the detrimental side-effect of coupling light power fluctuations into true cantilever bending caused by time-varying thermal stresses.
View Article and Find Full Text PDFFriction between the sliding tip of an atomic force microscope and a gold surface changes dramatically upon electrochemical oxidation of the gold surface. Atomic-scale variations of the lateral force reveal details of the friction mechanisms. Stick-slip motion with atomic periodicity on perfect Au(111) terraces exhibits extremely low friction and almost no dependence on load.
View Article and Find Full Text PDFRev Sci Instrum
January 2011
Optical beam deflection is a widely used method for detecting the deflection of atomic force microscope (AFM) cantilevers. This paper presents a first order derivation for the angular detection noise density which determines the lower limit for deflection sensing. Surprisingly, the cantilever radius of curvature, commonly not considered, plays a crucial role and can be exploited to decrease angular detection noise.
View Article and Find Full Text PDFPhotothermal excitation is a promising means of actuating microscale structures. It is gaining increased interest for its capability to excite atomic force microscopy (AFM) microcantilevers with wide frequency bandwidth in liquid environments yielding clean resonance peaks without spurious resonances. These capabilities are particularly relevant for high speed and high resolution, quantitative AFM.
View Article and Find Full Text PDFWe report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodology for the quantification of all the noise sources.
View Article and Find Full Text PDFIn this work we studied interactions between bacterial antigens and receptors on the surface of macrophages using atomic force microscopy (AFM). We used two bacterial cell wall components: lipopolysaccharide (LPS) derived from gram-negative Escherichia coli and exopolysaccharide (EPS) derived from gram-positive Lactobacillus rhamnosus. Interactions between these bacterial antigens and immune cell receptors were studied in peritoneal macrophages derived from two strains of mice, CBA and C3H/J, in which the Toll-like receptor 4 (TLR4) is genetically disabled.
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