We present a description of the capabilities and performance of the NAval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS) at the U.S. Naval Research Laboratory.
View Article and Find Full Text PDFWe present the ability to conduct single micrometer-sized uranium particle age-dating measurements on particles that are younger, smaller, and less enriched in U content than previously reported. Specifically, we use large geometry secondary ion mass spectrometry (LG-SIMS) to precisely measure the Th/U radiochronometer, combined with a systematic treatment of relevant parameters such as particle size, enrichment, and age, to achieve this development. We describe the necessary requirements for instrument background, interference rejection, abundance sensitivity, and other instrumental conditions that allow for this advance in single-particle uranium age-dating.
View Article and Find Full Text PDFA commercial secondary ion mass spectrometer (SIMS) was coupled to a ± 300 kV single-stage accelerator mass spectrometer (SSAMS). Positive secondary ions generated with the SIMS were injected into the SSAMS for analysis. This combined instrument was used to measure the uranium isotopic ratios in particles of three certified reference materials (CRM) of uranium, CRM U030a, CRM U500, and CRM U850.
View Article and Find Full Text PDFTime-of-flight-secondary ion mass spectrometry (TOF-SIMS) and laser ablation-inductively coupled plasma mass spectrometry (LA-ICPMS) were used for characterization and identification of unique signatures from a series of 18 Composition C-4 plastic explosives. The samples were obtained from various commercial and military sources around the country. Positive and negative ion TOF-SIMS data were acquired directly from the C-4 residue on Si surfaces, where the positive ion mass spectra obtained were consistent with the major composition of organic additives, and the negative ion mass spectra were more consistent with explosive content in the C-4 samples.
View Article and Find Full Text PDFWe report results of measurements of isotopic ratios obtained with atom probe tomography on U3O8 reference materials certified for their isotopic abundances of uranium. The results show good agreement with the certified values. High backgrounds due to tails from adjacent peaks complicate the measurement of the integrated peak areas as well as the fact that only oxides of uranium appear in the spectrum, the most intense of which is doubly charged.
View Article and Find Full Text PDFX-ray elemental mapping and X-ray spectrum imaging are powerful microanalytical tools. However, their scope is often limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue when large area (>10 cm²), heterogeneous materials such as concrete samples or others must be examined.
View Article and Find Full Text PDFThe application of surface analytical techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) is explored as a means of differentiating between composition C4 plastic explosives (C-4). Three different C-4 samples including U.S.
View Article and Find Full Text PDFThe surface chemistry and in-depth distribution of the composition of a poly(ethylene oxide) (PEO)-containing biodegradable poly(L-lactic acid) (PLLA) blend matrix system have been investigated using X-ray photoelectron spectroscopy (XPS). This study reports detailed quantitative compositional information using a novel numerical method for determining depth profiles. The PEO system studied is an amphiphilic Pluronic P104 surfactant, PEO-b-poly(propylene oxide) (PPO)-b-PEO.
View Article and Find Full Text PDFCluster secondary ion mass spectrometry (cluster SIMS) employing an SF5+ polyatomic primary ion sputter source in conjunction with a Bi3+ analysis source was used to obtain three-dimensional molecular information in polymeric-based drug-eluting stent coatings. The formulations of the coatings varied from 0% to 50% (w/w) sirolimus drug in poly(lactic-co-glycolic acid) and were prepared on both MP35N metal alloy coupons and bare metal stents. All cluster SIMS depth profiles obtained indicated a drug-enriched surface region, followed by a drug-depletion region, and finally a constant bulk composition region, similar to previous data obtained in polymeric blend systems.
View Article and Find Full Text PDFTime-of-flight secondary ion mass spectrometry (TOF-SIMS) was utilized to obtain characteristic mass spectra from three different smokeless powders and six different black powder samples. In these mass spectra, peaks indicative of both the organic and inorganic additive constituents in the gunpowders were observed. TOF-SIMS was able to successfully differentiate between the different black and smokeless gunpowder samples analyzed with the aid of principal components analysis (PCA), a multivariate statistical analysis approach often used to reduce the dimensionality of complex data.
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