Spatial-temporal characterization of photoemission in a streak-mode dynamic transmission electron microscope.

A long-standing motivation driving high-speed electron microscopy development is to capture phase transformations and material dynamics in real time with high spatial and temporal resolution. Current dynamic transmission electron microscopes (DTEMs) are limited to nanosecond temporal resolution and the ability to capture only a few frames of a transient event. With the motivation to overcome these limitations, we present our progress in developing a streak-mode DTEM (SM-DTEM) and demonstrate the recovery of picosecond images with high frame sequence depth.