Publications by authors named "Abdelhaq Boumaarouf"
Materials (Basel)
August 2023
Article Synopsis
- The study focuses on the effects of conductive atomic force microscopy (C-AFM) measurements on silicon carbide (SiC) surfaces, particularly looking at how strong electric fields can cause anodic oxidation due to water nanomeniscus formation.
- Experimental investigations reveal that the amount of oxidation during C-AFM is influenced by the doping levels of SiC and that the presence of a water nanomeniscus significantly increases oxide growth under applied polarization.
- The research also includes modeling to predict electric field distribution and current behavior at the AFM tip, showcasing that anodization occurs primarily in highly doped areas, which is confirmed through topographic analysis of SiC-MOSFET structures.
