Disentangling neighbors and extended range density oscillations in monatomic amorphous semiconductors.

High energy x-ray diffraction measurements of pure amorphous Ge were made and its radial distribution function (RDF) was determined at high resolution, revealing new information on the atomic structure of amorphous semiconductors. Fine structure in the second peak in the RDF provides evidence that a fraction of third neighbors are closer than some second neighbors; taking this into account leads to a narrow distribution of tetrahedral bond angles, (8.5 ± 0.

High-resolution study of (002, 113, 11-1) four-beam diffraction in Si.

The results of a high-resolution study of the (002, 113, 11 ̅1) four-beam diffraction in Si are presented. The incident synchrotron radiation beam was highly monochromated and collimated with a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes, in an attempt to experimentally approach plane-wave incident conditions. The Renninger scheme was used with the forbidden reflection reciprocal-lattice vector 002 normal to the crystal surface.

Atomic imaging of oxide-supported metallic nanocrystals.

The nucleation of noble metal nanoparticles on oxide surfaces can lead to dramatic enhancements in catalytic activity that are related to the atomic-scale formation of the nanoparticles and interfaces. For the case of submonolayer Pt deposited on the 2×1 SrTiO(3)(001) surface atomic-force microscopy shows the formation of nanoparticles. We use X-ray standing wave (XSW) atomic imaging to show that these nanoparticles are composed of Pt face-centered-cubic nanocrystals with cube-on-cube epitaxy laterally correlated to the substrate unit cell.

High-resolution study of (222, 113) three-beam diffraction in Ge.

The results of high-resolution analysis of the (222, >113) three-beam diffraction in Ge are presented. For monochromatization and angular collimation of the incident synchrotron beam a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes was used in an attempt to experimentally approach plane-wave incident conditions. Using this setup, for various azimuthal angles the polar angular curves which are very close to theoretical computer simulations for the plane monochromatic wave were measured.

Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence.

We describe the characterization of sputtered yttria-zirconia composition spread thin films by x-ray fluorescence (XRF). We also discuss our automated analysis of the XRF data, which was collected in a high throughput experiment at the Cornell High Energy Synchrotron Source. The results indicate that both the composition reproducibility of the library deposition and the composition measurements have a precision of better than 1 atomic percent.