Publications by authors named "A Avsar"

Article Synopsis
  • - The study investigates how factors like vaccination status, fear of vaccination, anxiety, alexithymia (difficulty identifying emotions), and type D personality (negative feelings and social inhibition) influence vaccination rates among a diverse group of university students from multiple countries.
  • - Using various psychological scales, researchers found that cognitive symptoms related to fear of vaccination and negative emotional states were significantly associated with lower vaccination rates, with cognitive fear being the strongest predictor.
  • - The results suggest that while fear of vaccination has consistent links across cultures, interventions must be tailored to specific cultural contexts to effectively increase vaccination rates.
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The coronavirus disease 2019 (COVID-19) pandemic had a meaningful impact on several areas of human activity. With respect to psychological assessment, the requirements to study the fear of vaccination as a means to diminish negative behaviour towards vaccination had been reported. This study aimed to evaluate the factorial invariance of the six-item Vaccination Fear Scale (VFS-6) across individuals and cultures.

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In anisotropic crystals, the direction-dependent effective mass of carriers can have a profound impact on spin transport dynamics. The puckered crystal structure of black phosphorus leads to direction-dependent charge transport and optical response, suggesting that it is an ideal system for studying anisotropic spin transport. To this end, we fabricate and characterize high-mobility encapsulated ultrathin black-phosphorus-based spin valves in a four-terminal geometry.

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Defects in solids are unavoidable and can create complex electronic states that can significantly influence the electrical and optical properties of semiconductors. With the rapid progress in the integration of 2D semiconductors in practical devices, it is imperative to understand and characterize the influence of defects in this class of materials. Here, we examine the electrical response of defect filling and emission using deep level transient spectroscopy (DLTS) and reveal defect states and their hybridization in a monolayer MOCVD-grown material deposited on CMOS-compatible substrates.

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